The application of leaf area scanner in the determination of banana leaf area in Brazil
Shenzhen Ananda Technology Co.,LTD , https://www.carmitek.com
The banana leaf area in Brazil is large. Under the condition of sufficient water and fertilizer, the leaf length can reach 3m and the leaf width can reach 1m. When it is implanted in the field for about 4 months, the leaf length can reach 1m or so, and the width is more than 0.4m. Leaf area meter to measure the leaf area, with the growth of the plant, the leaves are getting larger and larger, the grid cross method and copy quality method results are stable, but the workload is large, it takes a lot of time; Heavy law requires destructive sampling and measurement; the method of using digital image processing to determine the leaf area of ​​crops is highly accurate and fast, but the software has not been integrated yet, and it is still somewhat inconvenient to use. The length-width method is a simple and non-destructive measurement method, and does not require expensive instruments. It is the main method for determining leaf area. In the measurement of the leaf area by the long-width method, the correction coefficient is a necessary parameter.
In this experiment, Brazilian banana leaves were used as test materials at various growth stages. The leaf area was accurately measured using the leaf area scanner of the root analysis scanner. The relationship between leaf length, leaf width, leaf length × leaf width, and measured area of ​​Brazilian bananas was discussed. Establish a universal application model to provide a theoretical reference for the non-destructive measurement of banana leaf area. After 1 month of colonization, 2 Brazilian bananas were randomly selected for each treatment every 30 days. The leaves did not include the temporal lobe when the buds were drawn. For all healthy leaves, the root analysis scanner of Regent Inc. of Canada was used to determine the leaf area analysis scanning system. Area (A). At the same time using a ruler to determine the maximum length (L) and width of the blade.
During the vegetative growth period, the average absolute error, standard error of error, and correlation coefficient between the simulated and measured leaf area obtained from the product of banana leaf length, leaf width, and breadth and breadth of Brazilian banana all reached extremely significant levels. The average absolute error, standard error of error, and correlation coefficient between the simulated and measured leaf area obtained from the breadth and breadth of banana leaf length in Brazil reached a very significant level, indicating that the simulated value and the actual measured value are in good agreement. In the vegetative growth period, the leaf-area correlation coefficient of the long-breadth product simulation was the highest, the leaf length simulation was the second, and the long-width product simulation had the smallest standard error of the leaf area difference, and the leaf length was the second; in the bud and budding period. The leaf-length simulated leaf area has the highest correlation coefficient and the long-width product simulation is the second.
The determination of the area of ​​banana leaves in Brazil at different times by leaf area scanners can be concluded that in order to more accurately describe the leaf area of ​​bananas, the long-width product single linear equation is best during the vegetative growth period. The leaf area simulated by leaf length during budding period is not only accurate, but also has simple equations and is easy to calculate. Under limited data conditions, if there is only long or wide data, the corresponding model can be used. Leaf area scanners play an important role in the determination of larger leaf area.